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Reference details

Author(s) Year Title Reference View/Download

Tim Hopkins , Les Hatton

2008b

Exploring defect correlations in a major Fortran numerical library

Submitted for publicationNAG01_01-08.pdf

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Synopsis Invited Feedback Importance (/10, author rated :-) )
This is an analysis of a mature numerical Fortran software library comparing its defect history against a wide variety of well-known static measurements searching for significant correlation. We found that most of these static measurements individually correlate moderately well with a high degree of significance with the number of defects in a particular component but principle component analysis reveals that defect prediction is influenced by most to some modest extent but no particular factor dominated.

The analysis revealed a number of interesting properties however including the existence of negative correlations which may suggest that programmers take more care in certain scenarios and less care in others.

We go on to show that when static measurements are averaged across components, strong evidence of a logarithmic relationship with defect emerges.

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