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Reference details
| Author(s) | Year | Title | Reference | View/Download |
|---|---|---|---|---|
Tim Hopkins , Les Hatton | 2008b | Exploring defect correlations in a major Fortran numerical library | Submitted for publication | NAG01_01-08.pdf |
Synopsis and invited feedback
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| Synopsis | Invited Feedback | Importance (/10, author rated :-) ) |
|---|---|---|
| This is an analysis of a mature numerical Fortran software library comparing its defect
history against a wide variety of well-known static measurements
searching for significant correlation. We found that most of these
static measurements individually correlate moderately well with a high degree of
significance with the number of defects in a particular component but
principle component analysis reveals that defect prediction is influenced by most to some modest extent but no particular factor dominated.
The analysis revealed a number of interesting properties however including the existence of negative correlations which may suggest that programmers take more care in certain scenarios and less care in others. We go on to show that when static measurements are averaged across components, strong evidence of a logarithmic relationship with defect emerges. | None yet | 10 |
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Auto-generated: $Revision: 1.63 $, $Date: 2020/01/25 16:18:09 $, Copyright Les Hatton 2001-