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Reference details
Author(s)
| Year
| Title
| Reference
| View/Download
|
Les Hatton | 1997b | Re-examining the fault density - component size connection | IEEE Software, 14(2), p.89-97 | Ubend_IS697.pdf |
Synopsis and invited feedback
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Synopsis
| Invited Feedback
| Importance (/10, author rated :-) )
|
September 2009. I no longer believe in the U-bend described in this paper. I used data available at the time but meanwhile 10 years later, I have a lot more higher quality data and a different and more convincing model to explain the nature of the defect curve as described in the links below. To put it succinctly, defect growth and component size appear inextricably linked through the mechanism of information theory.
Observes from a number of experiments that the fault curve rises logarithmically with function size until it reaches a point at around 300 lines of code at which point it becomes quadratic. The implication is that both small and large components are unusually error prone. The paper then develops a mathematical model of reliability based on the properties of the human short term and long term memory which explains this. | None yet | 9 |
Related links
Auto-generated: $Revision: 1.63 $, $Date: 2020/01/25 16:18:09 $, Copyright Les Hatton 2001-
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