Tree

Navigation ...

lh_home.png
lh_personal.png

Scientific Writing ...

lh_AA.png
lh_AC.png
lh_BE.png
lh_CS.png
lh_DA.png
lh_ED.png
lh_GE.png
lh_GP.png
lh_LW.png
lh_MA.png
lh_ME.png
lh_PR.png
lh_RE.png
lh_SA.png
lh_SF.png

Other Writing ...

lh_AR.png
lh_ES.png
lh_MU.png
lh_SP.png

Reference details

Author(s) Year Title Reference View/Download

Les Hatton

1997b

Re-examining the fault density - component size connection

IEEE Software, 14(2), p.89-97Ubend_IS697.pdf

Synopsis and invited feedback

This work was or is being reviewed by domain-specific experts appointed independently.

If you would like to provide feedback just e-mail me here.

Synopsis Invited Feedback Importance (/10, author rated :-) )

September 2009. I no longer believe in the U-bend described in this paper. I used data available at the time but meanwhile 10 years later, I have a lot more higher quality data and a different and more convincing model to explain the nature of the defect curve as described in the links below. To put it succinctly, defect growth and component size appear inextricably linked through the mechanism of information theory.

Observes from a number of experiments that the fault curve rises logarithmically with function size until it reaches a point at around 300 lines of code at which point it becomes quadratic. The implication is that both small and large components are unusually error prone. The paper then develops a mathematical model of reliability based on the properties of the human short term and long term memory which explains this.

None yet9

Related links

Related papers and links

http://www.leshatton.org/statmech_0707.html

http://www.leshatton.org/variations_1008.html


Auto-generated: $Revision: 1.58 $, $Date: 2016/01/03 19:07:28 $, Copyright Les Hatton 2001-